Vacancy Description
The Opportunity
:The intern will work within the AMDD team on a project focused on developing advanced analysis tools and pipelines for X-Ray diffraction (XRD) patterns of mixed-metal oxide thin-films. They will use and develop automated Rietveld refinement tools to label XRD patterns and understand structure-property-processing relationships across a compositionally diverse dataset. They will perform phase identification on XRD patterns ranging from unary to ternary metal-oxides, and develop pipelines to perform automatic or human-assisted labeling of experimental data. They will investigate crystallite size, texturing, and strain across the dataset. This work will contribute to the development of automated workflows for phase identification from XRD, an essential bottleneck in accelerating high-throughput materials discovery.
Responsibilities
Scope the project to align with the core research efforts.
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